Published December 1, 2006
| Version v1
Journal article
Low count bias in gamma ray thickness detection and its correction
- 1. Department of Engineering Physics, Tsinghua University, Beijing (China)
Description
In this paper we introduce the latest discovery of Low Count Bias (LCB) effect in gamma ray material thickness measurement, which adversely affects the precision of measurement. Theoretical analysis of LCB effect is presented and the correction method is proposed. In order to further prove our theory, Monte Carlo simulation is taken and the result of bias correction is given
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.08.097;
- PII
- S0168-9002(06)01510-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 568
- Journal Issue
- 2
- Journal Page Range
- p. 912-914
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38038100
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; COMPUTERIZED SIMULATION; CORRECTIONS; GAMMA RADIATION; MONTE CARLO METHOD; RADIATION DETECTION; THICKNESS
- Descriptors DEC
- CALCULATION METHODS; DETECTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.