The nanosizing of fluorescent objects by 458 nm spatially modulated illumination microscopy using a simplified size evaluation algorithm

In fluorescent light microscopy, structured illumination approaches have emerged as a novel tool to analyse subwavelength sized objects in thick transparent specimens. In this report, new size measurements ('nanosizing') of small subwavelength sized fluorescent objects applying spatially modulated illumination (SMI) microscopy with an excitation wavelength of λex 458 nm are presented. These measurements were made using fluorescent particles with a given diameter. From the SMI data achieved, the size (diameter) was determined using special calibration curves derived from analytical considerations assuming a Gaussian dye distribution within the object. The results showed that with SMI microscopy combined with suitable calibration, size measurements of objects considerably smaller than the epifluorescent optical resolution at λex = 458 nm are feasible