Published 1970 | Version v1
Book Metadata-only

Secondary ion emission analysis

Creators

Description

no abstract available

Additional details

Publishing Information

Publisher
John Wiley and Sons, Inc.
Imprint Place
New York
Imprint Title
Modern Analytical Techniques for Metals and Alloys. Pt. 2
Imprint Pagination
p. 641-656.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4042296
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CHEMICAL ANALYSIS; ION BEAMS; IONS; MASS SPECTROMETERS
Descriptors DEC
BEAMS; CHARGED PARTICLES; MEASURING INSTRUMENTS; SPECTROMETERS