Electromagnetically induced reflectance and Fano resonance in one dimensional superconducting photonic crystal
- 1. Department of Materials Science and Metallurgical Engineering, Maulana Azad National Institute of Technology, Bhopal 462003, Madhya Pradesh (India)
- 2. Department of Physics, Babasaheb Bhimrao Ambedkar University, Lucknow 220625, Uttar Pradesh (India)
Description
In the present work, we demonstrate the generation of optical Fano resonance and electromagnetically induced reflectance (EIR) in one-dimensional superconducting photonic crystal (1D SPC) by numerical simulation using transfer matrix method as analysis tool. We investigated the optical response of 1D SPC structure consisting of alternate layer of two different superconductors and observed that the optical spectra of this structure exhibit two narrow reflectance peaks with zero reflectivity of sidebands. Further, we added a dielectric cap layer to this 1D SPC structure and found that addition of dielectric cap layer transforms the line shape of sidebands around the narrow reflectance peaks which leads to the formation of Fano resonance and EIR line shape in reflectance spectra. We also studied the effects of the number of periods, refractive index and thickness of dielectric cap layer on the lineshape of EIR and Fano resonances. It was observed that the amplitude of peak reflectance of EIR achieves 100% reflectance by increasing the number of periods.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2018.01.009Additional details
Identifiers
- DOI
- 10.1016/j.physc.2018.01.009;
- PII
- S0921453417305014;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 547
- Journal Page Range
- p. 36-40
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50046238
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; CRYSTALS; DIELECTRIC MATERIALS; FANO FACTOR; LAYERS; REFLECTIVITY; REFRACTIVE INDEX; SPECTRA; SUPERCONDUCTORS; THICKNESS; TRANSFER MATRIX METHOD
- Descriptors DEC
- CALCULATION METHODS; DIMENSIONLESS NUMBERS; DIMENSIONS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SIMULATION; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.