Published September 27, 2013 | Version v1
Journal article

Spike-timing dependent plasticity in a transistor-selected resistive switching memory

  • 1. Dipartimento di Elettronica, Informazione e Bioingegneria—Politecnico di Milano and IU.NET, I-20133 Milano (Italy)

Description

In a neural network, neuron computation is achieved through the summation of input signals fed by synaptic connections. The synaptic activity (weight) is dictated by the synchronous firing of neurons, inducing potentiation/depression of the synaptic connection. This learning function can be supported by the resistive switching memory (RRAM), which changes its resistance depending on the amplitude, the pulse width and the bias polarity of the applied signal. This work shows a new synapse circuit comprising a MOS transistor as a selector and a RRAM as a variable resistance, displaying spike-timing dependent plasticity (STDP) similar to the one originally experienced in biological neural networks. We demonstrate long-term potentiation and long-term depression by simulations with an analytical model of resistive switching. Finally, the experimental demonstration of the new STDP scheme is presented. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/24/38/384012

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
24
Journal Issue
38
Journal Page Range
[9 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45008075
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
AMPLITUDES; CALCULATION METHODS; LEARNING; MOS TRANSISTORS; NANOSTRUCTURES; NERVE CELLS; NEURAL NETWORKS; PLASTICITY; PULSES; SIMULATION
Descriptors DEC
ANIMAL CELLS; MECHANICAL PROPERTIES; SEMICONDUCTOR DEVICES; SOMATIC CELLS; TRANSISTORS