Published 2005 | Version v1
Miscellaneous

Observation of photoluminescence and microcavity effect in hydrogenated amorphous silicon oxide thin films (a-SiOx:H)

Creators

  • 1. Hacettepe University, Ankara (Turkey)

Description

The temperature dependent visible photoluminescence (PL) of hydrogenated amorphous silicon oxide thin films deposited in a PECVD system was investigated. All exhibited PL spectra with peak photon energy at 2.1 eV and are independent of the oxygen content of sample. The intensity of the PL increases with temperature. The PL was observed to re-form due to the Fabry-Perot (FP) microcavity effect that is the multiple reflections between two surfaces of the thin films. The orders of resonance modes and the positions were calculated and compared to the experimental data

Part of:
Book of Abstracts

Additional details

Additional titles

Original title (English)
Oezetler Kitabi

Publishing Information

Publisher
Mugla University
Imprint Place
Mugla (Turkey)
Imprint Title
Book of Abstracts
Imprint Pagination
1130 p.
Journal Page Range
p. 198
Report number
INIS-TR--112

Conference

Title
23. International Physics Congress of the Turkish Physical Society
Original Conference Title
2005 Dunya Fizik Yili Turk Fizik Dernegi 23. Uluslararasi Fizik Kongresi
Acronym
World Year of Physics 2005
Dates
13-16 Sep 2005
Place
Mugla (Turkey)

INIS

Country of Publication
Turkey
Country of Input or Organization
Turkey
INIS RN
37110286
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Numerical Data, Non-conventional Literature
Descriptors DEI
EXPERIMENTAL DATA; FABRY-PEROT INTERFEROMETER; HYDROGENATION; PHOTOLUMINESCENCE; SILICON OXIDES; THIN FILMS
Descriptors DEC
CHALCOGENIDES; CHEMICAL REACTIONS; DATA; EMISSION; FILMS; INFORMATION; INTERFEROMETERS; LUMINESCENCE; MEASURING INSTRUMENTS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SILICON COMPOUNDS

Optional Information

Notes
Imprint:Oezetler Kitabi