Published 1989 | Version v1
Journal article

Design and characteristics of a scattering chamber for PIXE analysis

  • 1. Universidad Nacional Autonoma de Mexico, Mexico City (Mexico). Inst. de Fisica

Description

A scattering chamber for Particle Induced x-ray Emission (PIXE) analysis is described. This chamber was designed and constructed for thin film thickness measurements and depth profiling. The chamber operation characteristics and versatility in materials analysis are shown. (Author). 18 refs, 6 figs

Additional details

Additional titles

Original title (Spanish)
Diseno y caracteristicas de una camara de dispersion para analisis de materiales con PIXE

Publishing Information

Journal Title
Instrumentacion y Desarrollo
Journal Volume
2
Journal Issue
9
Journal Page Range
p. 39-44.
ISSN
0187-8549