Evaluation of shot peened surfaces using characterization technique of three-dimensional surface topography
Creators
- 1. Department of Intelligent Machinery and Systems, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581 (Japan)
Description
Objective parameters to characterize global topography of three-dimensional surfaces have been derived. The idea of this evaluation is to separate the topography into two global form deviations and residual ones according to the degree of curved surfaces. A shot peened Almen strip is measured by profilometer and concrete parameters of inclination and circular-arc shaped global topography are extracted using the characterization technique. The arc height is calculated using the circular arc-shaped part and compared with a value measured by an Almen gauge. The relation between the coverage and roughness parameters is also investigated. The advantage of this evaluation is that it is possible to determine the arc height and the coverage at the same time from single measured topography. In addition, human error can be excluded from measurement results. This method has the wide application in the field of measurement
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/13/9/jpconf5_13_003.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 13
- Journal Issue
- 1
- Journal Page Range
- p. 9-12
- ISSN
- 1742-6596
Conference
- Title
- 7. international symposium on measurement technology and intelligent instruments
- Dates
- 6-8 Sep 2005
- Place
- Huddersfield (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36111567
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ERRORS; EVALUATION; HEIGHT; INCLINATION; MEASURING METHODS; ROUGHNESS; SURFACES; THREE-DIMENSIONAL CALCULATIONS; TOPOGRAPHY
- Descriptors DEC
- DIMENSIONS; SURFACE PROPERTIES