Published January 1, 2005 | Version v1
Journal article

Evaluation of shot peened surfaces using characterization technique of three-dimensional surface topography

  • 1. Department of Intelligent Machinery and Systems, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581 (Japan)

Description

Objective parameters to characterize global topography of three-dimensional surfaces have been derived. The idea of this evaluation is to separate the topography into two global form deviations and residual ones according to the degree of curved surfaces. A shot peened Almen strip is measured by profilometer and concrete parameters of inclination and circular-arc shaped global topography are extracted using the characterization technique. The arc height is calculated using the circular arc-shaped part and compared with a value measured by an Almen gauge. The relation between the coverage and roughness parameters is also investigated. The advantage of this evaluation is that it is possible to determine the arc height and the coverage at the same time from single measured topography. In addition, human error can be excluded from measurement results. This method has the wide application in the field of measurement

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/13/9/jpconf5_13_003.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
13
Journal Issue
1
Journal Page Range
p. 9-12
ISSN
1742-6596

Conference

Title
7. international symposium on measurement technology and intelligent instruments
Dates
6-8 Sep 2005
Place
Huddersfield (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36111567
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ERRORS; EVALUATION; HEIGHT; INCLINATION; MEASURING METHODS; ROUGHNESS; SURFACES; THREE-DIMENSIONAL CALCULATIONS; TOPOGRAPHY
Descriptors DEC
DIMENSIONS; SURFACE PROPERTIES