Published August 2006 | Version v1
Journal article

HF production in CMS-Resistive Plate Chambers

  • 1. Dipartimento interateneo di Fisica and sezione INFN, Bari (Italy)
  • 2. Universita degli studi della Basilicata and Sezione INFN, Naples (Italy)
  • 3. Dipartimento di Fisica and Sezione INFN, Naples (Italy)
  • 4. Dipartimento di Fisica Nucleare e Teorica and Sezione INFN, Pavia (Italy)
  • 5. INRNE, BAS, Soa (Bulgaria)
  • 6. University of Soa St. Kliment Ohridski (Bulgaria)

Description

The formation of highly reactive compounds in the gas mixture during Resistive Plate Chambers (RPCs) operation at the CERN Gamma Irradiation Facility (GIF) is studied. Results from two different types of chambers are discussed: 50 x 50 cm2 RPC prototypes and two final CMS-RB1 chambers. The RB1 detectors were also connected to a closed loop gas system. Gas composition, possible additional impurities as well as fluoride ions have been monitored in different gamma irradiation conditions both in open and closed loop mode. The chemical composition of the RPC electrode surface has also been analyzed using an electron microscope equipped with an EDS/X-ray

Additional details

Identifiers

DOI
10.1016/j.nuclphysbps.2006.07.002;
PII
S0920-5632(06)00421-X;

Publishing Information

Journal Title
Nuclear Physics. B, Proceedings Supplements
Journal Volume
158
Journal Page Range
p. 30-34
ISSN
0920-5632
CODEN
NPBSE7

Conference

Title
8. international workshop on resistive plate chambers and related detectors
Dates
10-12 Oct 2005
Place
Seoul (Korea, Republic of)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38044771
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CERN; CHEMICAL COMPOSITION; ELECTRODES; ELECTRON MICROSCOPES; GAMMA RADIATION; GAS TRACK DETECTORS; IMPURITIES; IONS; MIXTURES; X RADIATION
Descriptors DEC
CHARGED PARTICLES; DISPERSIONS; ELECTROMAGNETIC RADIATION; INTERNATIONAL ORGANIZATIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPES; RADIATION DETECTORS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.