Study of the photo-detection efficiency of FBK High-Density silicon photomultipliers
Creators
- 1. University of Trento, via Sommarive, 14, Trento (Italy)
- 2. Fondazione Bruno Kessler, Centre for Materials and Microsystems, via Sommarive, 18, Trento (Italy)
Description
This work presents a study of the factors contributing to the Photo-Detection Efficiency of Silicon Photomultipliers (SiPMs): Quantum Efficiency, Triggering Probability and Fill Factor. Two different SiPM High-Density technologies are tested, NUV-HD, based on n-on-p junction, and RGB-HD, based on p-on-n junction, developed at FBK, Trento. The quantum efficiency was measured on photodiodes produced along with the SiPMs. The triggering probability, as a function of wavelength and bias voltage, was measured on circular Single Photon Avalanche Diodes (SPADs) with 100% fill factor. Square SPADs, having the same layout of single SiPM cells, were studied to measure the effective fill factor and compare it to the nominal value. The comparison of the circular and square SPADs allows to get the transition region size between the effective active area of the cell and the one defined by the layout.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/11/11/P11010Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 11
- Journal Issue
- 11
- Journal Page Range
- p. P11010
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49010331
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DENSITY; DETECTION; FILL FACTORS; PHOTODIODES; PHOTOMULTIPLIERS; PHOTONS; P-N JUNCTIONS; QUANTUM EFFICIENCY; SILICON; WAVELENGTHS
- Descriptors DEC
- BOSONS; DIMENSIONLESS NUMBERS; EFFICIENCY; ELEMENTARY PARTICLES; ELEMENTS; EVALUATION; MASSLESS PARTICLES; PHOTOTUBES; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS