Published August 2008 | Version v1
Journal article

Can direct electron detectors outperform phosphor-CCD systems for TEM?

  • 1. Department of Materials, University of Oxford, Parks Road, Oxford, 0X1 3PH (United Kingdom)

Description

A new generation of imaging detectors is being considered for application in TEM, but which device architectures can provide the best images? Monte Carlo simulations of the electron-sensor interaction are used here to calculate the expected modulation transfer of monolithic active pixel sensors (MAPS), hybrid active pixel sensors (HAPS) and double sided Silicon strip detectors (DSSD), showing that ideal and nearly ideal transfer can be obtained using DSSD and MAPS sensors. These results highly recommend the replacement of current phosphor screen and charge coupled device imaging systems with such new directly exposed position sensitive electron detectors.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/126/1/012089

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
126
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
Acronym
EMAG 2007
Dates
3-7 Sep 2007
Place
Glasgow, Scotland (United Kingdom)