Published August 2008
| Version v1
Journal article
Can direct electron detectors outperform phosphor-CCD systems for TEM?
Creators
- 1. Department of Materials, University of Oxford, Parks Road, Oxford, 0X1 3PH (United Kingdom)
Description
A new generation of imaging detectors is being considered for application in TEM, but which device architectures can provide the best images? Monte Carlo simulations of the electron-sensor interaction are used here to calculate the expected modulation transfer of monolithic active pixel sensors (MAPS), hybrid active pixel sensors (HAPS) and double sided Silicon strip detectors (DSSD), showing that ideal and nearly ideal transfer can be obtained using DSSD and MAPS sensors. These results highly recommend the replacement of current phosphor screen and charge coupled device imaging systems with such new directly exposed position sensitive electron detectors.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/126/1/012089Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
- Acronym
- EMAG 2007
- Dates
- 3-7 Sep 2007
- Place
- Glasgow, Scotland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036553
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; COMPUTERIZED SIMULATION; ELECTRONS; IMAGES; MODULATION; MONTE CARLO METHOD; PHOSPHORS; SENSORS; SI MICROSTRIP DETECTORS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CALCULATION METHODS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SI SEMICONDUCTOR DETECTORS; SIMULATION