Published May 1, 2010 | Version v1
Journal article

Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8

  • 1. Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo 679-5198 (Japan)
  • 2. RIKEN, SPring-8, Sayo, Hyogo 679-5148 (Japan)
  • 3. Helmholtz Zentrum Berlin, BESSY-II, Albert-Einstein-Str. 15, 12489 Berlin (Germany)

Description

The long trace profiler (LTP) at SPring-8 has been upgraded to improve stability and resolution of slope measurement. The performances of the upgraded LTP at SPring-8 are presented by cross-checking measurements on a flat mirror with data obtained using Nanometer Optical Component Measuring Machine (NOM) at the Helmholtz Zentrum Berlin/BESSY-II.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.12.007

Additional details

Identifiers

DOI
10.1016/j.nima.2009.12.007;
PII
S0168-9002(09)02302-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
616
Journal Issue
2-3
Journal Page Range
p. 237-240
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
International workshop on X-ray mirror design, fabrication and metrology (IWXM)
Dates
22-24 Sep 2009
Place
Osaka (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41074958
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; BESSY STORAGE RING; MIRRORS; PERFORMANCE; RESOLUTION; SPRING-8 STORAGE RING; SYNCHROTRON RADIATION; X RADIATION
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.