Published 2019
| Version v1
Journal article
A method for avoiding following ion leakage from a Penning trap
Creators
- 1. Kyoto Institute of Technology, Department of Electronics, Kyoto (Japan)
Description
Ion leakages from a Penning trap are studied in the BX-U linear trap. The following leakage stops as the rise time of the upstream potential barrier sets to be longer. In the case, the number of trapped ions increases with the ion plasma still oscillating in the potential well of the Penning trap. (author)
Availability note (English)
Available from https://doi.org/10.1585/pfr.14.4401149Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma and Fusion Research
- Journal Volume
- 14
- Journal Issue
- special issue 3
- Journal Page Range
- p. 4401149.1-4401149.4
- ISSN
- 1880-6821
Conference
- Title
- 2. Asia-Pacific conference on plasma physics
- Acronym
- AAPPS-DPP2018
- Dates
- 12-17 Nov 2018
- Place
- Kanazawa, Ishikawa (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 51030102
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM LUMINOSITY; ELECTRIC CURRENTS; ELECTRODES; ION DENSITY; LANDAU LIQUID HELIUM THEORY; LITHIUM IONS; MAGNETIC FIELDS; PENNING EFFECT; PLASMA DIAGNOSTICS; PLASMA ION SOURCES; POTENTIALS; QUANTUM COMPUTERS
- Descriptors DEC
- CHARGED PARTICLES; COMPUTERS; CURRENTS; ION SOURCES; IONS
Optional Information
- Notes
- 14 refs., 4 figs.