Published December 1993 | Version v1
Journal article

Converting a bulk radiation-hardened BiCMOS technology into a dielectrically-isolated process

  • 1. Analog Devices Semiconductor, Wilmington, MA (United States)
  • 2. Naval Surface Warfare Center, Crane, IN (United States)
  • 3. RLP Research, Inc., Albuquerque, NM (United States)

Description

RBCMOS (Radiation-hardened Bipolar CMOS) is a 10-volt, junction-isolated, radiation-hardened BiCMOS process developed at Analog Devices. It is a radiation-hardened version of Analog Devices' commercial Advanced Bipolar CMOS (ABCMOS) process. Both of these processes are designed for advanced mixed-signal circuits such as high-performance D/A and A/D converters. To improve the dose-rate performance of the process, the DI version is being developed. The isolation scheme employed is similar to that used on state-of-the-art commercial complementary-bipolar processes. The starting material is a bonded wafer SOI substrate. Full oxide isolation is achieved with deep trenches that are filled with a combination of oxide and polysilicon. Excellent transistor yield has been demonstrated. The DI process exhibits improved performance in high dose-rate environments, including higher upset thresholds, and improved recovery times. The addition of the oxide isolation did not introduce any radiation sensitivites

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
40
Journal Issue
6Pt1
Journal Page Range
p. 1774-1779.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
international nuclear and space radiation effects conference.
Acronym
NSREC '93
Dates
19-23 Jul 1993.
Place
Snowbird, UT (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26026450
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRONIC CIRCUITS; FABRICATION; ION IMPLANTATION; NITROGEN IONS; RADIATION HARDENING
Descriptors DEC
CHARGED PARTICLES; HARDENING; IONS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS

Optional Information

Secondary number(s)
CONF-930704--.