Converting a bulk radiation-hardened BiCMOS technology into a dielectrically-isolated process
Creators
- 1. Analog Devices Semiconductor, Wilmington, MA (United States)
- 2. Naval Surface Warfare Center, Crane, IN (United States)
- 3. RLP Research, Inc., Albuquerque, NM (United States)
Description
RBCMOS (Radiation-hardened Bipolar CMOS) is a 10-volt, junction-isolated, radiation-hardened BiCMOS process developed at Analog Devices. It is a radiation-hardened version of Analog Devices' commercial Advanced Bipolar CMOS (ABCMOS) process. Both of these processes are designed for advanced mixed-signal circuits such as high-performance D/A and A/D converters. To improve the dose-rate performance of the process, the DI version is being developed. The isolation scheme employed is similar to that used on state-of-the-art commercial complementary-bipolar processes. The starting material is a bonded wafer SOI substrate. Full oxide isolation is achieved with deep trenches that are filled with a combination of oxide and polysilicon. Excellent transistor yield has been demonstrated. The DI process exhibits improved performance in high dose-rate environments, including higher upset thresholds, and improved recovery times. The addition of the oxide isolation did not introduce any radiation sensitivites
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 40
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 1774-1779.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- international nuclear and space radiation effects conference.
- Acronym
- NSREC '93
- Dates
- 19-23 Jul 1993.
- Place
- Snowbird, UT (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 26026450
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRONIC CIRCUITS; FABRICATION; ION IMPLANTATION; NITROGEN IONS; RADIATION HARDENING
- Descriptors DEC
- CHARGED PARTICLES; HARDENING; IONS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-930704--.