Structural and gasochromic properties of epitaxial WO3 films prepared by pulsed laser deposition
Creators
- 1. Quantum Beam Science Directorate, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan)
- 2. School of Engineering, Tohoku University, 6-6 Aramaki, Aoba-ku, Sendai 980-8579 (Japan)
Description
The structural and gasochromic properties of epitaxial tungsten trioxide (WO3) thin films, prepared by ArF excimer pulsed laser deposition under the controlled oxygen atmosphere, have been investigated. The WO3 films were grown on the α-Al2O3(011-bar2) substrates, as the oxygen pressure ranged from 0.57 to 1.20 Pa and the substrate temperature ranged from 432 to 538 deg. C. The deposited films were characterized by Rutherford backscattering spectroscopy (RBS)/channeling, X-ray diffraction, X-ray pole figures and Raman spectroscopy. RBS and XRD results demonstrated that monoclinic WO3 (0 0 1) films were successfully grown on the α-Al2O3(011-bar2) substrates. The crystal quality was improved by increasing both the oxygen pressure and the substrate temperature. Gasochromic coloration in the WO3 films by exposure to diluted hydrogen gas was found to correlate with the crystal quality of the films. The gasochromic coloration was suppressed by the epitaxial growth of the films
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2007.12.092Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2007.12.092;
- PII
- S0168-583X(08)00005-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 5
- Journal Page Range
- p. 802-806
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40012069
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ARGON FLUORIDES; ENERGY BEAM DEPOSITION; EPITAXY; HYDROGEN; LASER RADIATION; MONOCLINIC LATTICES; OXYGEN; PULSED IRRADIATION; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; THIN FILMS; TUNGSTATES; TUNGSTEN OXIDES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARGON COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONIZING RADIATIONS; IRRADIATION; LASER SPECTROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; RARE GAS COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.