Published August 2024
| Version v1
Journal article
Development of tender/soft X-ray absorption spectroscopy to operando measurements
- 1. Yamaguchi University, Graduate School of Sciences and Technology for Innovation, Ube, Yamaguchi (Japan)
Description
Operando X-ray absorption fine structure (XAFS) measurements are a very powerful tool to study catalytic materials under reaction conditions. Therefore, hard X-ray XAFS in the high-energy region has often been used to observe the electronic structure and local structure of catalytic materials. On the other hand, tender and soft X-ray XAFS measurements in the low-energy region, which can study light elements, have attracted much attention in recent years. In this article, we will introduce the setup and examples of operando XAFS observations using tender and soft X-rays. (author)
Availability note (English)
Available from https://catsj.jp/jnl/pageview?articlecd=66040005000Abstract (Japanese)
オペランドX線吸収微細構造(XAFS)測定は反応下で触媒材料を調べることができる非常に強力な手法であり,近年は軽元素を調べることが可能な低エネルギー領域のテンダーX線/軟X線XAFS測定に注目が集まっている.そこで今回は,テンダーX線/軟X線を用いたオペランドXAFS観測に関して,そのセットアップや測定例を紹介する.(著者)Additional details
Additional titles
- Original title (Japanese)
- テンダーX線/軟X線吸収分光法のオペランド測定への展開
- Augmented title (English)
- X-ray absorption fine structure (XAFS); Water splitting; Operando; Tender X-ray; Soft X-ray
Publishing Information
- Journal Title
- Shokubai
- Journal Volume
- 66
- Journal Issue
- 4
- Series
- 雑誌名:触媒
- Journal Page Range
- p. 197-203
- ISSN
- 0559-8958
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 56002110
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CATALYSTS; ELECTRONIC STRUCTURE; FINE STRUCTURE; SOFT X RADIATION; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SPECTROSCOPY; X RADIATION
Optional Information
- Notes
- 21 refs., 13 figs.