Published July 2003
| Version v1
Journal article
Comparison of surface composition determined by XPS and EPES
Creators
- 1. Hungarian Academy of Sciences, Debrecen (Hungary). Institute of Nuclear Research
Description
In the case of optoelectronic materials and polymers the precise knowledge of the surface atomic concentration ratios is crucial from scientific and technological points of view. The present work is a methodical study on quantitative analysis by the combination of XPS and EPES for two component inorganic compounds and polymers. (R.P.)
Additional details
Publishing Information
- Journal Title
- ATOMKI Annual Report
- Journal Issue
- no.17
- Journal Page Range
- p. 59
- ISSN
- 0231-3596
- CODEN
- AREAE9
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 34084808
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ALUMINIUM; CONCENTRATION RATIO; ELECTRON SPECTROSCOPY; EXCITATION; K SHELL; POLYMERS; QUANTITATIVE CHEMICAL ANALYSIS; SURFACE PROPERTIES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY-LEVEL TRANSITIONS; METALS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 12 refs.