Published July 1996
| Version v1
Journal article
Development of multi-layered CdTe semiconductor detectors
Creators
- 1. Mitsubishi Electric Corp., Tokyo (Japan)
Description
A multi-layered structure of CdTe elements has been proposed in order to improve the sensitivity in the high energy regions. The response of a semiconductor detector whose charge carriers mobility is as small as CdTe could be simulated and the degree of sensitivity improvement in the high energy regions could be predicted. Both the experimental result and the simulated result indicates that the full energy peak efficiency in the high energy regions can become high and the energy spectra can be improved by means of the multi-layered structure of detector elements. (author)
Additional details
Publishing Information
- Journal Title
- Hoshasen
- Journal Volume
- 22
- Journal Issue
- 3
- Journal Page Range
- p. 27-36.
- ISSN
- 0285-3604
- CODEN
- HOSHDJ
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 28009017
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CARRIER MOBILITY; CDTE SEMICONDUCTOR DETECTORS; CHARGE CARRIERS; EFFICIENCY; ENERGY SPECTRA; GAMMA RADIATION; MODIFICATIONS; PEAKS; SENSITIVITY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MOBILITY; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SPECTRA