A new automatic design method to develop multilayer thin film devices for high power laser applications
- 1. Bhabha Atomic Research Centre, Bombay (India). Multidisciplinary Research Scheme
- 2. Bhabha Atomic Research Centre, Bombay (India). Spectroscopy Div.
Description
Optical thin film devices play a major role in many areas of frontier technology like development of various laser systems to the designing of complex and precision optical systems. Design and development of these devices are really challenging when they are meant for high power laser applications. In these cases besides desired optical characteristics, the devices are expected to satisfy a whole range of different needs like high damage threshold, durability etc. In the present work a novel completely automatic design method based on Modified Complex Method has been developed for designing of high power thin film devices. Unlike most of the other methods it does not need any suitable starting design. A quarterwave design is sufficient to start with. If required, it is capable of generating its own starting design. The computer code of the method is very simple to implement. This report discusses this novel automatic design method and presents various practicable output designs generated by it. The relative efficiency of the method along with other powerful methods has been presented while designing a broadband IR antireflection coating. The method is also incorporated with 2D and 3D electric field analysis programmes to produce high damage threshold designs. Some experimental devices developed using such designs are also presented in the report. (author). 36 refs., 41 figs
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Additional details
Additional titles
- Augmented title (English)
- complex methods; damage threshold
Publishing Information
- Imprint Pagination
- 60 p.
- Report number
- BARC--1992/E/047
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 24056554
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ANTIREFLECTION COATINGS; COMPUTER-AIDED DESIGN; ELECTRIC FIELDS; EXPERIMENTAL DATA; FILTERS; GERMANIUM; INFRARED RADIATION; LANTHANUM FLUORIDES; LASER RADIATION; LASERS; MULTIPLEXERS; OPTIMIZATION; PHYSICAL RADIATION EFFECTS; REFLECTION; SENSITIVITY ANALYSIS; SILICON OXIDES; SUBSTRATES; THEORETICAL DATA; THICKNESS; THIN FILMS; THREE-DIMENSIONAL CALCULATIONS; TITANIUM OXIDES; TRANSMISSION; TWO-DIMENSIONAL CALCULATIONS; WAVELENGTHS; ZINC SULFIDES
- Descriptors DEC
- AMPLIFIERS; CHALCOGENIDES; COATINGS; DATA; DESIGN; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; INFORMATION; LANTHANUM COMPOUNDS; METALS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; RADIATIONS; RARE EARTH COMPOUNDS; SILICON COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS