Control of the structural, electrical and optical properties of spin coated NiO films by varying precursor molarity
- 1. Department of Physics, Faculty of Science, Taiz University, Taiz (Yemen)
- 2. School of Physics, Universiti Sains Malaysia (USM), 11800 USM, Penang (Malaysia)
Description
Highlights: • NiO films were grown on Si(100) substrate using sol-gel spin coating technique. • The crystallinity of the films was improved with increasing the precursor molarity. • The energy band gap of the films was decreased as the molarity was increased. • Resistivity of NiO films was increased with increasing the precursor molarity. -- Abstract: In this work, Nickel oxide (NiO) films were coated over Si (100) substrates at different precursor molarities (0.1–0.9 M) using sol-gel spin coating technique. The structural, morphological, electrical and optical properties of the films were investigated. X-ray diffraction and field-emission scanning electron microscopy (FESEM) results indicated that the crystalline quality of NiO films was improved with increasing the precursor molarity. All NiO films are composed of well-defined nanograins as confirmed by FESEM analysis. The average size of these nanograins was increased from ~20 to ~ 36 nm as the precursor molarity was increased from 0.1 to 0.9 M. The electrical measurements indicated that all NiO films exhibited p-type conductivity. The carrier concentration was decreased from 14.30 × 1016 to 0.0098 × 1016 cm−3 with the increase of molarity from 0.1 M to 0.9 M, whereas the resistivity and mobility were increased from 36.92 to 7840 Ω.cm and from 1.26 to 9.96 cm2 v−1 s−1, respectively. The energy band gap of the films was decreased from 3.85 to 3.31 eV upon increasing the molarity from 0.1 to 0.9 M. Based on our findings, NiO film prepared at 0.9 M displayed the best properties and hence it is a good candidate in various applications.
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2019.137554;
- PII
- S0040609019305826;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 690
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55041394
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRICAL PROPERTIES; FIELD EMISSION; NANOSTRUCTURES; NICKEL OXIDES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SPIN; SPIN-ON COATING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; FILMS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.