Published February 2010 | Version v1
Book

Characterization of silicon PIN diode based continuous radon monitoring system

  • 1. Radiation Safety Systems Division, Bhabha Atomic Research Centre, Mumbai (India)
  • 2. Electronics Division, Bhabha Atomic Research Centre, Mumbai (India)
  • 3. Radiological Protection and Advisory Division, Bhabha Atomic Research Centre, Mumbai (India)

Description

The applicability of locally available Silicon PIN diode detector for Continuous Radon Monitor (CRM) is discussed in this paper. A detailed characterization of 20 mm x 20 mm detector system with 1l hemispherical measuring cell in active sampling mode is discussed. The radon monitor designed uses electrostatic collection method to deposit positively charged 222Rn progenies on the detector surface and apply alpha spectroscopy method. The electro static collection of charged progeny and hence the sensitivity of the system was examined for a wide range of voltages. The sensitivity of the system is observed to be 0.50 cph/Bq.m-3 at an operating voltage of 800V. (author)

Part of:
Proceedings of DAE-BRNS national symposium on nuclear instrumentation - 2010

Additional details

Publishing Information

Publisher
Dept. of Atomic Energy
Imprint Place
Mumbai (India)
ISBN
81-88513-33-4
Imprint Title
Proceedings of DAE-BRNS national symposium on nuclear instrumentation - 2010
Imprint Pagination
679 p.
Journal Page Range
p. 335-337

Conference

Title
national symposium on nuclear instrumentation
Acronym
NSNI 2010
Dates
24-26 Feb 2010
Place
Mumbai (India)

Optional Information

Notes
7 refs., 5 figs.