Published January 2005
| Version v1
Journal article
New improvements in energy and spatial (x, y, z) resolution in AES and XPS applications
Creators
- 1. Faculty of Sciences, Analytical and Interfacial Chemistry, Universite Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles (Belgium)
- 2. Los Alamos National Laboratory, Tritium Science and Engineering, Mailstop C332, Los Alamos, NM 87545 (United States)
Description
This review presents the recent developments published in the literature about the use of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) at high energy or spatial resolution. The past and present improvements due to technology (analysers, excitation source), and to mathematical procedures are described and discussed. New trends in the application of AES and XPS are related
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2004.07.004;
- PII
- S0368-2048(04)00324-X;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 142
- Journal Issue
- 1
- Journal Page Range
- p. 1-25
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36044605
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; ENERGY RESOLUTION; EXCITATION; REVIEWS; SPATIAL RESOLUTION; USES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- DOCUMENT TYPES; ELECTRON SPECTROSCOPY; ENERGY-LEVEL TRANSITIONS; PHOTOELECTRON SPECTROSCOPY; RESOLUTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.