Published September 2021
| Version v1
Journal article
High-performance room-temperature extended-wavelength InAs-based middle-wavelength infrared photodetector
Creators
- 1. University of Chinese Academy of Sciences, Beijing, 100049 (China)
- 2. State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083 (China)
- 3. Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, 310024 (China)
- 4. Institute of Precision Optical Engineering, School of Physics, Science and Engineering, Tongji University, Shanghai, 200092 (China)
Description
Herein, a high-performance room-temperature extended-wavelength InAs-based barrier-type photodetector that operates in the 1.5-3.5 µm wavelength range is presented. The experimental results show that the uncooled photodetector exhibits a peak responsivity of 1.47 A W at 3 µm and a peak detectivity as high as 1.6 × 10 cm Hz W at zero bias, which is 3-10 times higher than that of available commercial InAs photodetectors. The external quantum efficiency at the peak responsivity is ≈ 63%. The nature of the detector's extended spectral response is investigated using numerical computation analyses, which indicate that such improvement is primarily contributed by the InAsSbP window layer. (© 2021 Wiley‐VCH GmbH)
Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 218
- Journal Issue
- 18
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 52109061
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BAND THEORY; CALCULATION METHODS; DARK CURRENT; DIFFUSION BARRIERS; ELLIPSOMETRY; HETEROJUNCTIONS; INDIUM ANTIMONIDES; INDIUM ARSENIDES; INDIUM PHOSPHIDES; INTERMEDIATE INFRARED RADIATION; NUMERICAL ANALYSIS; PERFORMANCE; PHOTODETECTORS; QUANTUM EFFICIENCY; SCANNING ELECTRON MICROSCOPY; SPECTRAL REFLECTANCE; SPECTRAL RESPONSE; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONIDES; ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; CURRENTS; DIFFRACTION; EFFICIENCY; ELECTRIC CURRENTS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; INDIUM COMPOUNDS; INFRARED RADIATION; LEAKAGE CURRENT; MATHEMATICS; MEASURING METHODS; MICROSCOPY; OPTICAL PROPERTIES; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS; SCATTERING; SEMICONDUCTOR JUNCTIONS; TEMPERATURE RANGE
Optional Information
- Notes
- AID: 2100281