Published 2014
| Version v1
Journal article
Impact of neutron-induced displacement damage on the ATREE response in LM124 operational amplifier
- 1. Universite Montpellier 2, IES-UMR CNRS 5214, F-34097 Montpellier cedex 5, (France)
- 2. Commissariat a l,Energie Atomique et aux Energies Alternatives, F-46500 Gramat, (France)
- 3. George Washington University, Washington, DC, (United States)
- 4. U.S. Naval Research Laboratory, Washington, DC 20375, (United States)
- 5. Thales Alenia Space, F-31037 Toulouse cedex 1, (France)
- 6. Centre National d,Etudes Spatiales, F-31401 Toulouse cedex 9, (France)
- 7. Direction Generale de l,Armement, F-92221, Bagneux cedex, (France)
Description
The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (op-amp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/10.1109/TNS.2014.2365048Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 61
- Journal Issue
- no.6
- Journal Page Range
- p. 3043-3049
- ISSN
- 0018-9499
INIS
- Country of Publication
- United States
- Country of Input or Organization
- France
- INIS RN
- 48042120
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMPLIFIERS; DOSE RATES; ELECTRONIC EQUIPMENT; FISSION NEUTRONS; RADIATION EFFECTS; SENSITIVITY; SIMULATION; X RADIATION
- Descriptors DEC
- BARYONS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; HADRONS; IONIZING RADIATIONS; NEUTRONS; NUCLEONS; RADIATIONS
Optional Information
- Notes
- 17 refs.