The limits of application of X-ray microanalysis - the resolution of the method
Description
If we study solids by X-microanalysis the information comes from the area of the finite volume. The size of studies area depends on material properties as well as on experimental conditions. Results of researches of very fine objects are always deformed by objectively existing limits. Experimentally obtained concentration profile of any element on the phase boundary of a multiphase material is the typical example. One can find that applying some mathematical methods based on the convolution theory it is possible to obtain results much closer to the real situation. Limitations of the methods have been theoretically discussed as well as some examples showing possibilities of its improvement have been presented in the paper. (author). 2 refs, 2 figs
Additional details
Additional titles
- Original title (Polish)
- Granice stosowalnosci mikroanalizy rentgenowskiej - przestrzenna zdolnosc rozdzielcza metody
Publishing Information
- Journal Title
- Inzynieria Materialowa
- Journal Volume
- 13
- Journal Issue
- 4-5
- Journal Page Range
- p. 113-115.
- ISSN
- 0208-6247
- CODEN
- INZME6
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 25042865
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CRYSTAL STRUCTURE; MICROANALYSIS; MICROSTRUCTURE; RADIATION SCATTERING ANALYSIS; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; DETECTION; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; SPECTROSCOPY