Published April 2005 | Version v1
Journal article

The Lund Nuclear Microprobe sub-micron set-up. Part I: Ion optics calculation

  • 1. Accelerator Facilities Division, Atomic Energy Centre, P.O. Box 164, Ramna, Dhaka 1000 (Bangladesh)
  • 2. Department of Nuclear Physics, Lund Institute of Technology, Lund University, P.O. Box 118, S-221 00 Lund (Sweden)

Description

A new beam line for generating a sub-micron beam spot for high-resolution nuclear microprobe applications has been constructed at the Lund nuclear microprobe facility. In this paper, the first in a series of three, a detailed theoretical investigation of different focusing systems is presented based on calculations performed with the computer programs PRAM and OXTRACE. Comparison is made between a doublet, a triplet, a quadruplet and a split quadruplet (two-stage focusing). For the split quadruplet all four quadrupole magnets were uncoupled. The conclusion from the calculations was that to obtain the smallest possible beam, the two-stage focusing system should be used. Such a focusing system (a doublet at each stage) has been chosen for the new sub-micron set-up at the Lund NMP laboratory. The first stage focuses the beam in an intermediate chamber, which has a high-resolution optical viewing system facilitating more control over the beam spot. This real image of the first stage is then used as a virtual object for the second stage

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.01.026;
PII
S0168-583X(05)00045-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
231
Journal Issue
1-4
Journal Page Range
p. 1-6
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
9. international conference on nuclear microprobe technology and applications
Acronym
ICNMTA-2004
Dates
13-17 Sep 2004
Place
Cavtat (Croatia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37013781
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM OPTICS; COMPUTER CODES; ENERGY RESOLUTION; FOCUSING; ION BEAMS; ION MICROPROBE ANALYSIS; MAGNETS; QUADRUPOLES; TRIPLETS
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; EQUIPMENT; MICROANALYSIS; MULTIPLETS; MULTIPOLES; NONDESTRUCTIVE ANALYSIS; RESOLUTION

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.