Published 2010 | Version v1
Miscellaneous

Analysis of synchrotron X-ray diffraction patterns from fluorotic enamelsamples

  • 1. Universidade do Estado do Rio deJaneiro (UERJ), RJ (Brazil)
  • 2. Universidade Estadual de Campinas(UNICAMP), SP (Brazil)
  • 3. Universidade de Sao Paulo (USP), Ribeirao Preto, SP (Brazil)
  • 4. Laboratorio Nacional de LuzSincrotron (LNLS), Campinas, SP (Brazil)
  • 5. Universidade Federal doRio de Janeiro (UFRJ), RJ (Brazil)

Description

no abstract available

Part of:
Proceedings of the 20. RAU: Annual meeting of the LNLS users. Abstracts of scientific papers

Additional details

Additional titles

Original title (English)
Anais da 20. RAU: Reuniao anual de usuarios do LNLS. Resumos de trabalhoscientificos

Publishing Information

Imprint Title
Proceedings of the 20. RAU: Annual meeting of the LNLS users. Abstractsof scientific papers
Imprint Pagination
273 p.
Journal Page Range
p. 102

Conference

Title
Annual meeting of the LNLS users
Original Conference Title
20. RAU: Reuniao anual de usuarios do LNLS
Acronym
20. RAU
Dates
22-23 Feb 2010
Place
Campinas, SP (Brazil)

Optional Information

Notes
Imprint:Anais da 20. RAU: Reuniao anual de usuarios do LNLS. Resumos de trabalhoscientificos