High-field Josephson effect caused by the inside-grain vortices
Creators
- 1. A.A. Galkin Donetsk Physicotechnical Institute, NAS, 72 R. Luxemburg, 83114 Donetsk (Ukraine)
- 2. Department of Applied Mathematics, Donbass Engineering Academy, 84313 Kramatorsk (Ukraine)
Description
We present a theoretical prediction of the new effects for critical currents across single grain boundaries in polycrystalline superconductors being under an applied magnetic field. It was shown that Josephson oscillation should be observed not only in the case of the increasing of the magnetic flux through the junction but also when vortex penetrates inside grain. In the intergrain Josephson junction the critical transport current is strongly dependent on the normalized grain size ratio, grain anisotropy ratio and grain coupling strength. These results imply that achieving a high degree of texture along these parameters is important for the obtaining of very high critical currents in pure polycrystalline samples. Also, it is shown that in contrast to the well-known Fraunhofer dependence, the period of oscillations corresponds to adding flux quantums per two grains
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2005.05.093;
- PII
- S0375-9601(05)00915-1;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 343
- Journal Issue
- 6
- Journal Page Range
- p. 454-461
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036958
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANISOTROPY; CHARGED-PARTICLE TRANSPORT; CRITICAL CURRENT; GRAIN BOUNDARIES; GRAIN SIZE; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; MAGNETIC FIELDS; MAGNETIC FLUX; OSCILLATIONS; POLYCRYSTALS; SUPERCONDUCTORS; TEXTURE; VORTICES
- Descriptors DEC
- CRYSTALS; CURRENTS; ELECTRIC CURRENTS; MICROSTRUCTURE; RADIATION TRANSPORT; SIZE; SUPERCONDUCTING JUNCTIONS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.