In situ monitoring of the electrochemical absorption of deuterium into palladium by x-ray diffraction using synchrotron-wiggler radiation
- 1. Naval Research Lab., Washington, DC (United States)
Description
With low energy x-rays, such as those from a Cu x-ray tube, only the outer few microns of a metallic sample can be probed. This low penetrating power prohibits structural studies from being carried out on the interior of an electrode in an electrochemical cell because of absorption by the cell material, electrodes and the electrolyte. The work described in this paper circumvents this problem by utilizing high energy, high brightness x-rays produced on the superconducting wiggler beam line, X-17C, at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory. The penetrating power of the higher energy x-rays allowed Pd diffraction spectra to be obtained in-situ on a 1 mm diameter Pd wire cathode during electrolysis of heavy water. Moreover, the beam (28 x 28 microm in cross-section) allowed diffraction spectra to be acquired as a function of distance across the sample. Spectra were recorded in 50 microm steps from the edge of the Pd wire to its core. This was done at 2 minute intervals as a function of electrolysis time. The α-β phase transition induced in the Pd while deuterium was electrochemically absorbed was observed by monitoring the Pd-(422) diffraction peaks. Results allowed the diffusion rate and the diffusivity of deuterium atoms in the Pd wire to be determined. Other features of the structural changes associated with the absorption of deuterium into Pd are reported
Additional details
Publishing Information
- Publisher
- Materials Research Society
- Imprint Place
- Warrendale, PA (United States)
- ISBN
- 1-55899-430-0
- Imprint Title
- Applications of synchrotron radiation techniques to materials science 4
- Imprint Pagination
- 398 p.
- Series
- Materials Research Society symposium proceedings, Volume 524
- Journal Page Range
- p. 127-132
- ISSN
- 0272-9172
Conference
- Title
- Spring meeting of the Materials Research Society
- Dates
- 13-17 Apr 1998
- Place
- San Francisco, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30021424
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ABSORPTION; CRYSTAL-PHASE TRANSFORMATIONS; DEUTERIUM; DIFFUSION; ELECTROLYSIS; EXPERIMENTAL DATA; NSLS; PALLADIUM; PERMEABILITY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DATA; DIFFRACTION; ELEMENTS; HYDROGEN ISOTOPES; INFORMATION; ISOTOPES; LIGHT NUCLEI; METALS; NUCLEI; NUMERICAL DATA; ODD-ODD NUCLEI; PHASE TRANSFORMATIONS; PLATINUM METALS; RADIATION SOURCES; SCATTERING; SORPTION; STABLE ISOTOPES; SYNCHROTRON RADIATION SOURCES; TRANSITION ELEMENTS
Optional Information
- Funding organization
- Office of Naval Research, Washington, DC (United States)
- Secondary number(s)
- CONF-980405--