Potential energy diagram for hydrogen near vanadium surface
Description
In order to examine the mechanism of the hydrogen recombination phenomenon, the potential energy diagram for hydrogen isotopes near a vanadium surface was experimentally studied. One side of a sample membrane was continuously exposed to deuterium plasma and the surface density and the bulk concentration of deuterium were measured by nuclear reaction analysis. At the same time, the permeation flux to the other side was monitored. The recombination coefficient on the plasma-exposed surface agreed well with the theoretical value for a clean surface. The activation energies for the recombination process and the jump process from the surface to the bulk were found to be 0.23 and 0.04 eV, respectively. There is a barrier potential of 0.29 eV on the vacuum-facing surface, which can be attributed to surface impurities
Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2004.04.073;
- PII
- S0022311504002144;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 329-333
- Journal Issue
- 1
- Journal Page Range
- p. 434-437
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 11. International conference on fusion reactor materials
- Acronym
- ICFRM-11
- Dates
- 7-12 Dec 2003
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36030023
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ENERGY; DENSITY; DEUTERIUM; DIAGRAMS; HYDROGEN; IMPURITIES; MEMBRANES; MILLI EV RANGE; NUCLEAR REACTION ANALYSIS; PLASMA; POTENTIAL ENERGY; RECOMBINATION; SURFACES; VANADIUM
- Descriptors DEC
- CHEMICAL ANALYSIS; ELEMENTS; ENERGY; ENERGY RANGE; HYDROGEN ISOTOPES; INFORMATION; ISOTOPES; LIGHT NUCLEI; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEI; ODD-ODD NUCLEI; PHYSICAL PROPERTIES; STABLE ISOTOPES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.