Published August 1, 2004 | Version v1
Journal article

Potential energy diagram for hydrogen near vanadium surface

Description

In order to examine the mechanism of the hydrogen recombination phenomenon, the potential energy diagram for hydrogen isotopes near a vanadium surface was experimentally studied. One side of a sample membrane was continuously exposed to deuterium plasma and the surface density and the bulk concentration of deuterium were measured by nuclear reaction analysis. At the same time, the permeation flux to the other side was monitored. The recombination coefficient on the plasma-exposed surface agreed well with the theoretical value for a clean surface. The activation energies for the recombination process and the jump process from the surface to the bulk were found to be 0.23 and 0.04 eV, respectively. There is a barrier potential of 0.29 eV on the vacuum-facing surface, which can be attributed to surface impurities

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2004.04.073;
PII
S0022311504002144;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
329-333
Journal Issue
1
Journal Page Range
p. 434-437
ISSN
0022-3115
CODEN
JNUMAM

Conference

Title
11. International conference on fusion reactor materials
Acronym
ICFRM-11
Dates
7-12 Dec 2003
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36030023
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACTIVATION ENERGY; DENSITY; DEUTERIUM; DIAGRAMS; HYDROGEN; IMPURITIES; MEMBRANES; MILLI EV RANGE; NUCLEAR REACTION ANALYSIS; PLASMA; POTENTIAL ENERGY; RECOMBINATION; SURFACES; VANADIUM
Descriptors DEC
CHEMICAL ANALYSIS; ELEMENTS; ENERGY; ENERGY RANGE; HYDROGEN ISOTOPES; INFORMATION; ISOTOPES; LIGHT NUCLEI; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEI; ODD-ODD NUCLEI; PHYSICAL PROPERTIES; STABLE ISOTOPES; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.