Published June 2001
| Version v1
Journal article
Nanoscale defect formation on InP surface by swift gold ion impact
Description
The atomic force microscopy (AFM) was used to image nanoscale defect on InP surface induced by 100 MeV Au8+ ions. These defects manifest themselves as pits or hillocks in AFM images depending on the scan direction. The nuclear energy loss (Sn) of swift heavy ion was found to be a decisive parameter for the creation of nanoscale defects, which otherwise supposed to be neglected at the surface for inelastic electronic energy loss (Se) dominant processes
Additional details
Identifiers
- PII
- S0168583X01004438;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 179
- Journal Issue
- 1
- Journal Page Range
- p. 37-41
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33054113
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; ENERGY LOSSES; GOLD IONS; INDIUM PHOSPHIDES; INELASTIC SCATTERING; MEV RANGE
- Descriptors DEC
- CHARGED PARTICLES; CRYSTAL STRUCTURE; ENERGY RANGE; INDIUM COMPOUNDS; IONS; LOSSES; MICROSCOPY; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.