Published April 7, 2008
| Version v1
Journal article
Enhanced electron trapping by a static longitudinal magnetic field in laser wakefield acceleration
- 1. Korea Electrotechnology Research Institute, Changwon, Kyongnam 641-120 (Korea, Republic of)
- 2. APRI and School of Photon Science and Technology, Gwangju Institute of Science and Technology, Gwangju 500-712 (Korea, Republic of)
Description
An externally applied longitudinal magnetic field was found to enhance the particle trapping in the laser wakefield acceleration. When a static magnetic field of a few tens of tesla is applied in parallel with the propagation direction of a driving laser pulse, it is shown from two-dimensional particle-in-cell simulations that total charge of the trapped beam and its maximum energy increase. The analysis of electron trajectories strongly suggests that the enhanced trapping originates from the suppression of the transverse motion by the magnetic field. The enhanced trapping by the magnetic field was observed consistently for various values of the plasma density, the amplitude of the laser pulse and pulse spot size
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2007.12.045Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2007.12.045;
- PII
- S0375-9601(07)01787-2;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 15
- Journal Page Range
- p. 2684-2687
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40043889
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ACCELERATION; AMPLITUDES; ELECTROMAGNETIC FIELDS; ELECTRONS; LASER RADIATION; MAGNETIC FIELDS; PARTICLES; PHOTON BEAMS; PLASMA DENSITY; PULSES; SIMULATION; TRAPPING; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.