Published April 7, 2008 | Version v1
Journal article

Enhanced electron trapping by a static longitudinal magnetic field in laser wakefield acceleration

  • 1. Korea Electrotechnology Research Institute, Changwon, Kyongnam 641-120 (Korea, Republic of)
  • 2. APRI and School of Photon Science and Technology, Gwangju Institute of Science and Technology, Gwangju 500-712 (Korea, Republic of)

Description

An externally applied longitudinal magnetic field was found to enhance the particle trapping in the laser wakefield acceleration. When a static magnetic field of a few tens of tesla is applied in parallel with the propagation direction of a driving laser pulse, it is shown from two-dimensional particle-in-cell simulations that total charge of the trapped beam and its maximum energy increase. The analysis of electron trajectories strongly suggests that the enhanced trapping originates from the suppression of the transverse motion by the magnetic field. The enhanced trapping by the magnetic field was observed consistently for various values of the plasma density, the amplitude of the laser pulse and pulse spot size

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2007.12.045

Additional details

Identifiers

DOI
10.1016/j.physleta.2007.12.045;
PII
S0375-9601(07)01787-2;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
372
Journal Issue
15
Journal Page Range
p. 2684-2687
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40043889
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ACCELERATION; AMPLITUDES; ELECTROMAGNETIC FIELDS; ELECTRONS; LASER RADIATION; MAGNETIC FIELDS; PARTICLES; PHOTON BEAMS; PLASMA DENSITY; PULSES; SIMULATION; TRAPPING; TWO-DIMENSIONAL CALCULATIONS
Descriptors DEC
BEAMS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.