Published December 2021
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Monte Carlo simulation to determine the correction factor for gamma-ray self-attenuation
Creators
- 1. Center for Nuclear Technologies, Vietnam Atomic Energy Institute, Ho Chi Minh City (Viet Nam)
Description
The low background gamma spectroscopy using a High-Purity Germanium (HPGe) semiconductor detector is widely used in Vietnam. When using this technique, we must pay attention to the phenomenon of gamma self-attenuation in the measured samples. Particularly, when determining the activity concentration of radionuclides that emit low-energy gamma, self-absorption can significantly reduce the detector's count rate and give a rise in the error of measured results. In this report, we determined the gamma self-attenuation correction factor using the Monte Carlo simulation method. (author)
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53125191.pdf
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Additional details
Additional titles
- Original title (Vietnamese)
- Mo phong Monte Carlo xac dinh he so hieu chinh tu hap thu gamma
Publishing Information
- Imprint Title
- Vietnam Conference on Nuclear Science and Technology VINANST-14. Agenda and Abstracts
- Imprint Pagination
- 246 p.
- Journal Page Range
- 6 p.
- Report number
- INIS-VN--005
Conference
- Title
- 14. Vietnam Conference on Nuclear Science and Technology
- Original Conference Title
- Hoi nghi Khoa hoc va Cong nghe Hat nhan Toan quoc lan thu 14
- Acronym
- VINANST-14
- Dates
- 9-10 Dec 2021
- Place
- Da Lat, Lam Dong (Viet Nam)
INIS
- Country of Publication
- Viet Nam
- Country of Input or Organization
- Viet Nam
- INIS RN
- 53125191
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S61: RADIATION PROTECTION AND DOSIMETRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATTENUATION; COMPUTER CODES; COMPUTERIZED SIMULATION; CORRECTIONS; COUNTING RATES; GAMMA RADIATION; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; RADIOISOTOPES; SELF-ABSORPTION; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- ABSORPTION; CALCULATION METHODS; ELECTROMAGNETIC RADIATION; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; ISOTOPES; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SIMULATION; SORPTION; SPECTROSCOPY
Optional Information
- Notes
- 8 refs, 2 figs, 1 tab Imprint:Conference program and paper abstracts only; Section C: Radiation Measurement, Radiation Safety And Environmental Monitoring;Do do phan ung bang ky thuat tieng on va ap dung trong lo Da Lat