Published July 1, 2019 | Version v1
Journal article

Design of AlGaN-based lasers with a buried tunnel junction for sub-300 nm emission

  • 1. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH (United States)
  • 2. NRC Research Associate, Resident at Center for Computational Materials Science, US Naval Research Laboratory, Washington, DC (United States)

Description

This paper discusses the design of electrically-pumped AlGaN-based in-plane lasers emitting at ∼290 nm. Our laser design utilizes strained Al0.5Ga0.5N quantum wells, and a novel polarization engineered AlGaN/InGaN/AlGaN-based tunnel junction. The low resistive tunnel junction is used as an intracavity contact in the device in place of the resistive p-type contact; which leads to improved hole injection and a reduced threshold voltage. Hence, room-temperature continuous-wave laser operation could be enabled. Strategies to improve the performance of the tunnel junction contact through the incorporation of low concentrations of boron in the highly-doped AlGaN tunnel junction layers as a means to increase the polarization sheet charge are also discussed. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6641/ab19cd

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
34
Journal Issue
7
Journal Page Range
[6 p.]
ISSN
0268-1242
CODEN
SSTEET

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52039099
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
BORON; DESIGN; DOPED MATERIALS; ELECTRIC POTENTIAL; HOLES; LASERS; LAYERS; POLARIZATION; PUMPING; QUANTUM WELLS; TUNNEL JUNCTIONS
Descriptors DEC
ELEMENTS; MATERIALS; NANOSTRUCTURES; SEMIMETALS