Published June 1995 | Version v1
Journal article

Laser interferometry for the diagnostic of nanobunches in electron-positron colliders or Shintake close-quote s monitor revisited

Creators

  • 1. Universite Pierre et Marie Curie, 4 place Jussieu, 75252 Paris CEDEX 05 (France)

Description

Small electron bunches passing through laser driven interference fringes are diagnosed thanks to Compton scattering signals. The amount of scattered light is related to both real and imaginary parts of the spatial Fourier transform of the transverse density distribution. Even and odd parts of the profile of bunches whose size compares with or is slightly smaller than the optical wavelength can be reconstructed. The size of bunches transversally much smaller than the optical wavelength can be evaluated by scanning across the fringes while varying the optical intensity. copyright 1995 American Institute of Physics

Additional details

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
335
Journal Issue
1
Journal Page Range
p. 320-326.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. advanced accelerator concepts workshop.
Dates
13-18 Jun 1994.
Place
Fontana, WI (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27075217
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM MONITORING; COMPTON EFFECT; ELECTRON BEAMS; ELECTRON DENSITY; INTERFEROMETRY; LASER RADIATION; LINEAR COLLIDERS; POSITRON BEAMS
Descriptors DEC
ACCELERATORS; BASIC INTERACTIONS; BEAMS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; INTERACTIONS; LEPTON BEAMS; LINEAR ACCELERATORS; MONITORING; PARTICLE BEAMS; RADIATIONS; SCATTERING

Optional Information

Secondary number(s)
CONF-940681--.