Published June 1995
| Version v1
Journal article
Laser interferometry for the diagnostic of nanobunches in electron-positron colliders or Shintake close-quote s monitor revisited
Creators
- 1. Universite Pierre et Marie Curie, 4 place Jussieu, 75252 Paris CEDEX 05 (France)
Description
Small electron bunches passing through laser driven interference fringes are diagnosed thanks to Compton scattering signals. The amount of scattered light is related to both real and imaginary parts of the spatial Fourier transform of the transverse density distribution. Even and odd parts of the profile of bunches whose size compares with or is slightly smaller than the optical wavelength can be reconstructed. The size of bunches transversally much smaller than the optical wavelength can be evaluated by scanning across the fringes while varying the optical intensity. copyright 1995 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 335
- Journal Issue
- 1
- Journal Page Range
- p. 320-326.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. advanced accelerator concepts workshop.
- Dates
- 13-18 Jun 1994.
- Place
- Fontana, WI (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27075217
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM MONITORING; COMPTON EFFECT; ELECTRON BEAMS; ELECTRON DENSITY; INTERFEROMETRY; LASER RADIATION; LINEAR COLLIDERS; POSITRON BEAMS
- Descriptors DEC
- ACCELERATORS; BASIC INTERACTIONS; BEAMS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; INTERACTIONS; LEPTON BEAMS; LINEAR ACCELERATORS; MONITORING; PARTICLE BEAMS; RADIATIONS; SCATTERING
Optional Information
- Secondary number(s)
- CONF-940681--.