Thermal behavior, structure formation and optical characteristics of nanostructured basic fuchsine thin films
- 1. Department of Physics, Faculty of Science at New Damietta, Damietta University, 34517, New Damietta (Egypt)
- 2. Department of Physics, Damietta Cancer Institute, Damietta (Egypt)
- 3. Department of Physics, Faculty of Applied Medical Sciences at Turabah Branch, Taif University, 21995 (Saudi Arabia)
- 4. Department of Physics, Faculty of Science, Port Said University, Port Said (Egypt)
Description
Thin films of basic fuchsine, BF, are prepared by thermal evaporation technique. The data of thermal gravimetric analysis, TGA, showed that BF has a thermal stability up to the temperature of 265 °C. The structural characteristics of BF thin films are investigated by using X-ray diffraction, and atomic force microscope techniques. BF is polycrystalline in powder form; it becomes nanocrystallites in thin film condition. Annealing temperatures decreased crystallites size and influenced optical constants of BF films. Optical constants of BF films were estimated by using spectrophotometer measurements of transmittance and reflectance in the spectral range from 190 to 2500 nm. The dependence of absorption coefficient on the photon energy and annealing temperatures was determined and the analysis of the results showed that the optical transition in BF films is indirect allowed one. The onset and fundamental energy gap of BF thin films are 1.91 and 3.72 eV, respectively and they decrease by annealing temperatures. The optical dielectric constants and dispersion parameters of BF thin film are calculated and showed remarkable dependence on photon energy and annealing temperatures. - Graphical abstract: Display Omitted - Highlights: • Polycrystalline BF powder becomes nanocrystallites film upon thermal deposition. • BF has thermal stability up to 265 °C. • BF can be applied as optical filter material. • The type of electron transition is indirect allowed with Eg of 1.91 eV. • Annealing temperatures influenced absorption and dispersion parameters of BF films
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2015.07.013Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2015.07.013;
- PII
- S0254-0584(15)30203-0;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 163
- Journal Page Range
- p. 45-53
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47044565
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; DISPERSIONS; ENERGY GAP; EVAPORATION; NANOSTRUCTURES; OPTICAL FILTERS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; PERMITTIVITY; PHOTONS; POLYCRYSTALS; SPECTROPHOTOMETERS; STABILITY; THERMAL GRAVIMETRIC ANALYSIS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- BOSONS; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTALS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FILMS; FILTERS; GRAVIMETRIC ANALYSIS; HEAT TREATMENTS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SORPTION; THERMAL ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.