Published May 15, 2003 | Version v1
Journal article

Comparison of classical and BEN nucleation studied on thinned Si (1 1 1) samples: a HRTEM study

Description

The mechanisms involved in the early stages of bias enhanced nucleation (BEN) of diamond have been investigated on thinned Si (1 1 1) areas using several TEM techniques (high resolution, selected area diffraction and nanodiffraction). A comparison with a hot filament chemical vapour deposition synthesis (HFCVD) performed without BEN emphasizes the helpful role of BEN in diamond nucleation: besides the speeding up of the nucleation kinetic and the great increase of the nucleation density, a significant part of the diamond nuclei are oriented with respect to the Si substrate

Additional details

Identifiers

DOI
10.1016/S0169-4332(03)00086-2;
arXiv
arXiv:quant-ph/0112095v3;
PII
S0169433203000862;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
212-213
Journal Issue
2
Journal Page Range
p. 912-919
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
11. international conference on solid films and surfaces
Acronym
ICSFS-11
Dates
8-12 Jul 2002
Place
Marseille (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38086662
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; COMPARATIVE EVALUATIONS; CRYSTAL GROWTH; DIAMONDS; DIFFRACTION; FILAMENTS; NANOSTRUCTURES; NUCLEATION; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CARBON; CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; MICROSCOPY; MINERALS; NONMETALS; SCATTERING; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.