Room temperature tunability of Mo-doped VO2 nanofilms across semiconductor to metal phase transition
Creators
- 1. Nanotech Research Lab, Department of Physics, National Institute of Technology, Srinagar 190006, Kashmir (India)
- 2. Material Science Division, Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067 (India)
Description
The phase transition temperature (Tt) across semiconductor-to-metal transition (SMT) of the vanadium dioxide (VO2) thin films can be tuned to room temperature either by reducing the grain size of crystallites to nanoscale or by doping them with molybdenum (Mo6+) ions. In this work, the combined response of these effects (quantum size effect and doping mechanism) has been demonstrated by studying the structural and electrical transport properties of low concentration (0, 1, 3 and 5%) Mo6+-doped VO2 nanofilms across SMT. Room temperature value of Tt = 303.7 K was achieved for Mo6+-doped VO2 nanofilms as compared to 333.2 K of pristine VO2 nanofilms and against 340 K of bulk VO2 thin films. A systematic analysis of charge carrier mobility (μ), Seebeck coefficient (s) and charge carrier concentration (n) was performed for the first time to the best knowledge of the authors. Decrease in μ and increase in s were observed across SMT with increase in doping percentage of Mo6+-ions. n increased by 1 to 4 orders of magnitude across SMT for the samples which contributed almost entirely for the resistance change. Resistance ratio (Rs/RM) and hysteresis width (ΔH) diminished whereas hysteresis sharpness (ΔT) escalated across SMT with the increase of Mo+6-ions. - Highlights: • Mo-doped VO2 nanofilms have been fabricated on sapphire substrates by solgel method. • Room temperature phase transition was achieved by effects of nanosize and Mo-doping. • Carrier concentration increased up to 4 orders of magnitude across phase transition. • Seebeck coefficient increased and mobility decreased with increase in Mo-doping.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.02.006Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.02.006;
- PII
- S0040-6090(17)30095-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 625
- Journal Page Range
- p. 155-162
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50023846
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARRIER MOBILITY; COMPARATIVE EVALUATIONS; CONCENTRATION RATIO; DOPED MATERIALS; MOLYBDENUM IONS; NANOSTRUCTURES; SAPPHIRE; SUBSTRATES; SULFUR IONS; THIN FILMS; TRANSITION TEMPERATURE; VANADIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CORUNDUM; DIMENSIONLESS NUMBERS; EVALUATION; FILMS; IONS; MATERIALS; MINERALS; MOBILITY; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.