Ion bombardment induced smoothing of amorphous metallic surfaces: Experiments versus computer simulations
Creators
- 1. I. Physikalisches Institut, Georg-August-Universitaet Goettingen, Friedrich-Hund-Platz 1, 37077 Goettingen (Germany)
Description
Smoothing of rough amorphous metallic surfaces by bombardment with heavy ions in the low keV regime is investigated by a combined experimental-simulational study. Vapor deposited rough amorphous Zr65Al7.5Cu27.5 films are the basis for systematic in situ scanning tunneling microscopy measurements on the smoothing reaction due to 3 keV Kr+ ion bombardment. The experimental results are directly compared to the predictions of a multiscale simulation approach, which incorporates stochastic rate equations of the Langevin type in combination with previously reported classical molecular dynamics simulations [Phys. Rev. B 75, 224107 (2007)] to model surface smoothing across length and time scales. The combined approach of experiments and simulations clearly corroborates a key role of ion induced viscous flow and ballistic effects in low keV heavy ion induced smoothing of amorphous metallic surfaces at ambient temperatures
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 77
- Journal Issue
- 15
- Journal Page Range
- p. 155406-155406.6
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40023197
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; AMBIENT TEMPERATURE; AMORPHOUS STATE; COMPUTERIZED SIMULATION; COPPER ALLOYS; FORECASTING; HEAVY IONS; ION BEAMS; KEV RANGE 01-10; KRYPTON IONS; MOLECULAR DYNAMICS METHOD; ROUGHNESS; SCANNING TUNNELING MICROSCOPY; STOCHASTIC PROCESSES; SURFACES; THIN FILMS; VAPOR DEPOSITED COATINGS; VISCOUS FLOW; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; BEAMS; CALCULATION METHODS; CHARGED PARTICLES; COATINGS; ENERGY RANGE; FILMS; FLUID FLOW; IONS; KEV RANGE; MICROSCOPY; SIMULATION; SURFACE PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2008 The American Physical Society