Published May 2002 | Version v1
Miscellaneous

Development of the critical thickness correlation for an improvement of MARS code dryout model

  • 1. KAERI, Taejon (Korea, Republic of)
  • 2. Seoul National Univ., Seoul (Korea, Republic of)

Description

The mechanical film dryout analysis defines that the critical heat flux arises when liquid film calculation from evaporation, droplet entrainment and deposition gets dryout. The dryout of film is generally assumed when film thickness becomes zero. However, it was proven that the complete dryout assumption can estimate CHF well for uniform heating case but can not simulate accurately for non-uniform heating case. The critical thickness concept is an appropriate approach physically because there is a possibility of instantaneous disappearance of liquid film when it gets very thin. Therefore, the dryout phenomenon was modeled introducing critical thickness concept and development of proper critical thickness correlation. In this study, MARS code and some steady state dryout experimental data were used to develop a critical thickness correlation. The version including new critical thickness correlation was assessed using the several dryout CHF tests of various test conditions including non uniform heating case and flow reduction transient test and the results showed enhanced agreement with the experimental data

Part of:
Proceedings of the KNS-KARP Joint spring meeting

Additional details

Publishing Information

Publisher
KNS
Imprint Place
Taejon (Korea, Republic of)
Imprint Title
Proceedings of the KNS-KARP Joint spring meeting
Imprint Pagination
[CD-ROM]
Journal Page Range
[15 p.]

Conference

Title
2002 joint spring meeting of the KNS-KARP
Dates
23-24 May 2002
Place
Gwangju (Korea, Republic of)

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
34009688
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, Numerical Data, Non-conventional Literature
Descriptors DEI
CORRELATIONS; CRITICAL HEAT FLUX; DRYOUT; EXPERIMENTAL DATA; FLOW RATE; M CODES; THICKNESS; THIN FILMS
Descriptors DEC
COMPUTER CODES; DATA; DIMENSIONS; FILMS; HEAT FLUX; INFORMATION; NUMERICAL DATA

Optional Information

Notes
11 refs, 12 figs, 3 tabs