A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements
Creators
- 1. Department of Mechano-Informatics, Graduate School of Information Science and Technology, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo (Japan)
- 2. Department of Mechanical Engineering, School of Engineering, Tokyo Denki University, 5 Senju Asahi-cho, Adachi-ku, Tokyo (Japan)
- 3. Information and Robot Technology Research Initiative, The University of Tokyo, 7-3-1 Hongo, Bunkyouku, Tokyo (Japan)
- 4. School of Fundamental Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo (Japan)
Description
This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I–V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/23/4/045015Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 23
- Journal Issue
- 4
- Journal Page Range
- [7 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47053889
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; EXCITATION; FLUORESCENCE; IRRADIATION; MICROSCOPES; PHOTOELECTRIC EFFECT; PIEZOELECTRICITY; SENSITIVITY; TIME RESOLUTION; WAVELENGTHS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRICITY; EMISSION; ENERGY-LEVEL TRANSITIONS; LUMINESCENCE; PHOTON EMISSION; PHYSICAL PROPERTIES; RESOLUTION; TIMING PROPERTIES