Published July 18, 2005
| Version v1
Journal article
Ion-beam texturing of uniaxially textured Ni films
- 1. IGC-SuperPower, LLC, 450 Duane Avenue, Schenectady, New York 12304 (United States)
- 2. University of Florida, Department of Materials Science and Engineering, 106 Rhines Hall, P.O. Box 116400, Gainesville, Florida 32611 (United States)
Description
The formation of biaxial texture in uniaxially textured Ni thin films via Ar-ion irradiation is reported. The ion-beam irradiation was not simultaneous with deposition. Instead, the ion beam irradiates the uniaxially textured film surface with no impinging deposition flux, which differs from conventional ion-beam-assisted deposition. The uniaxial texture is established via a nonion beam process, with the in-plane texture imposed on the uniaxial film via ion beam bombardment. Within this sequential ion beam texturing method, grain alignment is driven by selective etching and grain overgrowth
Additional details
Identifiers
- DOI
- 10.1063/1.1957121;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 87
- Journal Issue
- 3
- Journal Page Range
- p. 031907-031907.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37017704
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON IONS; DEPOSITION; ETCHING; GRAIN GROWTH; ION BEAMS; ION IMPLANTATION; IRRADIATION; NICKEL; TEXTURE; THIN FILMS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; FILMS; IONS; METALS; SURFACE FINISHING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 American Institute of Physics