Published July 18, 2005 | Version v1
Journal article

Ion-beam texturing of uniaxially textured Ni films

  • 1. IGC-SuperPower, LLC, 450 Duane Avenue, Schenectady, New York 12304 (United States)
  • 2. University of Florida, Department of Materials Science and Engineering, 106 Rhines Hall, P.O. Box 116400, Gainesville, Florida 32611 (United States)

Description

The formation of biaxial texture in uniaxially textured Ni thin films via Ar-ion irradiation is reported. The ion-beam irradiation was not simultaneous with deposition. Instead, the ion beam irradiates the uniaxially textured film surface with no impinging deposition flux, which differs from conventional ion-beam-assisted deposition. The uniaxial texture is established via a nonion beam process, with the in-plane texture imposed on the uniaxial film via ion beam bombardment. Within this sequential ion beam texturing method, grain alignment is driven by selective etching and grain overgrowth

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
87
Journal Issue
3
Journal Page Range
p. 031907-031907.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37017704
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ARGON IONS; DEPOSITION; ETCHING; GRAIN GROWTH; ION BEAMS; ION IMPLANTATION; IRRADIATION; NICKEL; TEXTURE; THIN FILMS
Descriptors DEC
BEAMS; CHARGED PARTICLES; ELEMENTS; FILMS; IONS; METALS; SURFACE FINISHING; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2005 American Institute of Physics