Published 1989 | Version v1
Book

Progress in kinetic inductance thermometers for X-ray calorimeters

  • 1. California Univ., Berkeley (USA)
  • 2. Lawrence Livermore National Laboratory, CA (USA)

Description

Conventional X-ray microcalorimeters have so far used ion-implanted resistors for thermometers. Recently, however, several new methods for sensing small temperature changes have been suggested that are nondissipative. Such devices may have intrinsically better energy resolution by eliminating the Johnson noise present in resistive devices. The use of kinetic inductance thermometers for X-ray microcalorimeters is being investigated. This technique exploits the strong temperature dependence of magnetic penetration depth of thin superconducting films. The prototype system, designed for operation at 1.5 K, uses films of aluminum and tin. Once the expected temperature sensitivity and alpha particle detection have been demonstrated, aluminum will be replaced with titanium or another material with a suitable critical temperature and the device will be operated at 0.3 K. At this temperature, the energy resolution from thermal noise should be sufficiently good to allow X-ray detection. 12 refs

Additional details

Publishing Information

Publisher
Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
Imprint Title
EUV, X-ray, and gamma-ray instrumentation for astronomy and atomic physics; Proceedings of the Meeting, San Diego, CA, Aug. 7-11, 1989
Imprint Pagination
690 p.
Journal Page Range
p. 414-422.

Conference

Title
SPIE conference on EUV, X-ray, and gamma ray instrumentation for astronomy and atomic physics.
Dates
7-11 Aug 1989.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22023633
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALPHA PARTICLES; ALUMINIUM; CALORIMETERS; NOISE; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE; THERMOMETERS; TIN; X-RAY DETECTION
Descriptors DEC
CHARGED PARTICLES; DETECTION; ELEMENTS; FILMS; HELIUM IONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTION; RADIATIONS

Optional Information

Secondary number(s)
CONF-8908120--.