Progress in kinetic inductance thermometers for X-ray calorimeters
- 1. California Univ., Berkeley (USA)
- 2. Lawrence Livermore National Laboratory, CA (USA)
Description
Conventional X-ray microcalorimeters have so far used ion-implanted resistors for thermometers. Recently, however, several new methods for sensing small temperature changes have been suggested that are nondissipative. Such devices may have intrinsically better energy resolution by eliminating the Johnson noise present in resistive devices. The use of kinetic inductance thermometers for X-ray microcalorimeters is being investigated. This technique exploits the strong temperature dependence of magnetic penetration depth of thin superconducting films. The prototype system, designed for operation at 1.5 K, uses films of aluminum and tin. Once the expected temperature sensitivity and alpha particle detection have been demonstrated, aluminum will be replaced with titanium or another material with a suitable critical temperature and the device will be operated at 0.3 K. At this temperature, the energy resolution from thermal noise should be sufficiently good to allow X-ray detection. 12 refs
Additional details
Publishing Information
- Publisher
- Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (USA)
- Imprint Title
- EUV, X-ray, and gamma-ray instrumentation for astronomy and atomic physics; Proceedings of the Meeting, San Diego, CA, Aug. 7-11, 1989
- Imprint Pagination
- 690 p.
- Journal Page Range
- p. 414-422.
Conference
- Title
- SPIE conference on EUV, X-ray, and gamma ray instrumentation for astronomy and atomic physics.
- Dates
- 7-11 Aug 1989.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22023633
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA PARTICLES; ALUMINIUM; CALORIMETERS; NOISE; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE; THERMOMETERS; TIN; X-RAY DETECTION
- Descriptors DEC
- CHARGED PARTICLES; DETECTION; ELEMENTS; FILMS; HELIUM IONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTION; RADIATIONS
Optional Information
- Secondary number(s)
- CONF-8908120--.