Published June 25, 2010
| Version v1
Journal article
Low-temperature, self-catalyzed growth of Si nanowires
Creators
- 1. Istituto per la Microelettronica e i Microsistemi del Consiglio Nazionale delle Ricerche, via del Fosso del Cavaliere 100, I-00133 Rome (Italy)
- 2. Istituto Officina dei Materiali del Consiglio Nazionale delle Ricerche, Basovizza, I-34149 Trieste (Italy)
- 3. Istituto per la Microelettronica e i Microsistemi del Consiglio Nazionale delle Ricerche, Stradale Primosole 50, I-95121 Catania (Italy)
Description
High densities of self-catalyzed Si nanowires have been grown at temperatures down to 320 deg. C on different Si substrates, whose surfaces have been roughened by simple physical or chemical treatments. The particular substrates are Si(110) cleavage planes, chemically etched Si(111) surfaces and microcrystalline Si obtained by laser annealing thin amorphous Si layers. The NW morphology depends on the growth surface. Transmission electron microscopy indicates that the NWs are made of pure Si with a crystalline core structure. Reflectivity measurements confirm this latter finding.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/21/25/255601Additional details
Identifiers
- DOI
- 10.1088/0957-4484/21/25/255601;
- PII
- S0957-4484(10)54091-1;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 21
- Journal Issue
- 25
- Journal Page Range
- [9 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43025139
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; LASERS; LAYERS; MORPHOLOGY; QUANTUM WIRES; REFLECTIVITY; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0065-0273 K; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; HEAT TREATMENTS; MICROSCOPY; NANOSTRUCTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES; TEMPERATURE RANGE