Published June 25, 2010 | Version v1
Journal article

Low-temperature, self-catalyzed growth of Si nanowires

  • 1. Istituto per la Microelettronica e i Microsistemi del Consiglio Nazionale delle Ricerche, via del Fosso del Cavaliere 100, I-00133 Rome (Italy)
  • 2. Istituto Officina dei Materiali del Consiglio Nazionale delle Ricerche, Basovizza, I-34149 Trieste (Italy)
  • 3. Istituto per la Microelettronica e i Microsistemi del Consiglio Nazionale delle Ricerche, Stradale Primosole 50, I-95121 Catania (Italy)

Description

High densities of self-catalyzed Si nanowires have been grown at temperatures down to 320 deg. C on different Si substrates, whose surfaces have been roughened by simple physical or chemical treatments. The particular substrates are Si(110) cleavage planes, chemically etched Si(111) surfaces and microcrystalline Si obtained by laser annealing thin amorphous Si layers. The NW morphology depends on the growth surface. Transmission electron microscopy indicates that the NWs are made of pure Si with a crystalline core structure. Reflectivity measurements confirm this latter finding.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/21/25/255601

Additional details

Identifiers

DOI
10.1088/0957-4484/21/25/255601;
PII
S0957-4484(10)54091-1;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
21
Journal Issue
25
Journal Page Range
[9 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43025139
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ANNEALING; LASERS; LAYERS; MORPHOLOGY; QUANTUM WIRES; REFLECTIVITY; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0065-0273 K; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; HEAT TREATMENTS; MICROSCOPY; NANOSTRUCTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES; TEMPERATURE RANGE