Published 2008
| Version v1
Miscellaneous
Measurement of M XRF Cross section Using Photoionization
Creators
- 1. Ataturk University, Faculty of Arts and Sciences, Department of Physics, Erzurum (Turkey)
Description
The Mi (i=ξ, α, β, γ, m) and total M-shell X-ray fluorescence (XRF) cross sections for Th and U were measured at 5.96 keV incident photon energy. The measurements were performed using a Fe-55 radioisotope as the photon source and a Si(Li) detector. The Mξ, Mα, Mβ, Mγ, Mm spectra for investigated elements have been derived from the measured total M shell X-ray spectra by peak fitting process. The measured X-ray fluorescence cross sections were compared with the theoretical values. The results in the present paper are found to be in good agreement with the calculated values
Additional details
Additional titles
- Original title (Turkish)
- Oezetler Kitabi
Publishing Information
- Imprint Title
- Book of Abstracts
- Imprint Pagination
- 764 p.
- Journal Page Range
- p. 109
- Report number
- INIS-TR--131
Conference
- Title
- Turkish Physical Society 25. International Physics Congress
- Original Conference Title
- Turk Fizik Dernegi 25. Uluslararasi Fizik Kongresi
- Dates
- 25-29 Aug 2008
- Place
- Bodrum (Turkey)
INIS
- Country of Publication
- Turkey
- Country of Input or Organization
- Turkey
- INIS RN
- 40104115
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ANISOTROPY; CALCULATION METHODS; COMPTON EFFECT; CROSS SECTIONS; CRYSTAL STRUCTURE; M SHELL; PHOTOIONIZATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BASIC INTERACTIONS; CHEMICAL ANALYSIS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTRONIC STRUCTURE; INTERACTIONS; IONIZATION; NONDESTRUCTIVE ANALYSIS; SCATTERING; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Imprint:Oezetler Kitabi