Technique of X-ray spectral analysis of homogeneous samples of complex composition in case of excitation of radiation by accelerated ions

Approximation validity for dependence of cross section of ionization of atoms by protons on the depth of their penetration into the sample for the case of bombarding the target by heavy ions is verified. This approximation is used for development of the technique of X-ray spectral analysis of homogeneous samples of complex composition in case of excitation of radiation by heavy ions in a wide range of surface densities. One of the advantages of the technique over the existing ones is the possibility to perform the analysis of thin samples using massive standards