SPECT system performance test and analysis of results

Objective: To analyze the influence factors on, and the relationship between, the system performance parameters by testing SPECT equipment. Methods: By reference to National Electrical Manufactures Association standards and manufacturer's specifications, the performances of a total of 31 SPECTs in 12 provinces were measured, for the first time, with regard to their system spatial resolution (SSR), system planar sensitivity (SPS) and tomographic spatial resolution (TPR). Results: The results were as follows: (7.90 ± 0.62) mm for SSR, with the highest 9.46 mm and the lowest 7.04 mm; (78.54 ± 13.17) s^-1·MBq^-1 for SPS, with the highest 123.80 s^-1·MBq^-1 and the lowest 56.70 s^-1·MBq^-1; and (13.12 ± 2.59) mm for TSR, with the highest 18.13 mm and the lowest 8.45 mm. These values indicated a nearly consistent upward and downward trend and could meet the clinical requirements by comparison with the manufactuer's specifications. Conclusions: Mutual restrictions have been shown between SSR and SPS. Increased thickness of the system crystal plane can improve the SPS, but also has a negative impact on the SSR. For all the above reasons, it is the optimum solution to choose the right type of collimator and crystal thickness for different clinical applications. (authors)