Crystal Plasticity Model Validation Using Combined High-Energy Diffraction Microscopy Data for a Ti-7Al Specimen

High-Energy Diffraction Microscopy (HEDM) is a 3-d x-ray characterization method that is uniquely suited to measuring the evolving micromechanical state and microstructure of polycrystalline materials during in situ processing. The near-field and far-field configurations provide complementary information; orientation maps computed from the near-field measurements provide grain morphologies, while the high angular resolution of the far-field measurements provide intergranular strain tensors. The ability to measure these data during deformation in situ makes HEDM an ideal tool for validating micro-mechanical deformation models that make their predictions at the scale of individual grains. Crystal Plasticity Finite Element Models (CPFEM) are one such class of micro-mechanical models. While there have been extensive studies validating homogenized CPFEM response at a macroscopic level, a lack of detailed data measured at the level of the microstructure has hindered more stringent model validation efforts. We utilize an HEDM dataset from an alphatitanium alloy (Ti-7Al), collected at the Advanced Photon Source, Argonne National Laboratory, under in situ tensile deformation. The initial microstructure of the central slab of the gage section, measured via near-field HEDM, is used to inform a CPFEM model. The predicted intergranular stresses for 39 internal grains are then directly compared to data from 4 far-field measurements taken between ~4% and ~80% of the macroscopic yield strength. In conclusion, the intergranular stresses from the CPFEM model and far-field HEDM measurements up to incipient yield are shown to be in good agreement, and implications for application of such an integrated computational/experimental approach to phenomena such as fatigue and crack propagation is discussed.