The prediction of thick target electron bremsstrahlung spectra in the 0.25-50 keV energy range
Creators
Description
The importance of electron bremsstrahlung has continuously grown since its early discovery more than one century ago, increasingly being involved in different scientific areas. The present work deals with the prediction of thick-target bremsstrahlung spectrum in the frame of scanning electron microprobe analysis. X-ray energies considered range from 0.25 to 50 keV, whereas the models discussed involve electron incident energies up to 50 keV. The main attempts proposed to describe the thick target bremsstrahlung by electron impact are reviewed. Developments carried out from theoretical bases are considered, as well as the role played by Monte Carlo simulations. The results achieved by empirical models are particularly emphasized in view of their reliability in the description of the bremsstrahlung spectrum by means of analytical functions of the atomic number, beam energy and photon energy
Availability note (English)
Available from http://dx.doi.org/10.1016/j.sab.2007.11.009Additional details
Identifiers
- DOI
- 10.1016/j.sab.2007.11.009;
- PII
- S0584-8547(07)00395-3;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 63
- Journal Issue
- 1
- Journal Page Range
- p. 1-8
- ISSN
- 0584-8547
- CODEN
- SAASBH
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39085472
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- BREMSSTRAHLUNG; COMPUTERIZED SIMULATION; ELECTRON MICROPROBE ANALYSIS; ELECTRON SCANNING; ELECTRONS; EV RANGE 100-1000; FORECASTING; KEV RANGE 01-10; KEV RANGE 10-100; MONTE CARLO METHOD; SPECTRA; X RADIATION
- Descriptors DEC
- CALCULATION METHODS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; EV RANGE; FERMIONS; IONIZING RADIATIONS; KEV RANGE; LEPTONS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.