Published September 1, 2014 | Version v1
Journal article Metadata-only

Superconductivity in textured Bi clusters/Bi2Te3 films

Creators

  • 1. Faculty of Basic Sciences, Can Tho University of Medicine and Pharmacy, 179 Nguyen Van Cu Street, Can Tho (Viet Nam)
  • 2. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30049, Taiwan (China)
  • 3. Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan (China)
  • 4. Institute of Physics, National Chiao Tung University, Hsinchu 300, Taiwan (China)

Description

We report superconductivity at an onset critical temperature below 3.1 K in topological insulator ∼200-nm-thick Bi2Te3 thin films grown by pulsed laser deposition. Using energy-dispersive X-ray spectroscopy elemental mapping and Auger electron spectroscopy elemental depth profiling, we clearly identified bismuth (Bi) precipitation and Bi cluster signatures. Superconductivity in the Bi2Te3 films was attributed to the proximity effect of Bi clusters precipitated on the surface of the Bi2Te3 films

Additional details

Identifiers

DOI
10.1063/1.4894779;

Publishing Information

Journal Title
APL Materials
Journal Volume
2
Journal Issue
9
Journal Page Range
p. 096105-096105.7
ISSN
2166-532X
CODEN
AMPADS

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46009744
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AUGER ELECTRON SPECTROSCOPY; BISMUTH; BISMUTH TELLURIDES; CRITICAL TEMPERATURE; ENERGY BEAM DEPOSITION; LASER RADIATION; PRECIPITATION; PROXIMITY EFFECT; PULSED IRRADIATION; SUPERCONDUCTIVITY; THIN FILMS; X-RAY SPECTROSCOPY
Descriptors DEC
BISMUTH COMPOUNDS; CHALCOGENIDES; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; IRRADIATION; METALS; PHYSICAL PROPERTIES; RADIATIONS; SEPARATION PROCESSES; SPECTROSCOPY; SURFACE COATING; TELLURIDES; TELLURIUM COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE

Optional Information

Notes
(c) 2014 Author(s)